EEL 3396, section 1486X, Fall 2004
MWF
period 8,
Note: We will have our
first quiz this Wednesday September 8, but consider it as a bonus
because of Frances. If you do well it may replace a poor result later
on. If you do poorly, it is not counted.
Graded HW, tests, and quizzes can be picked up from the black cabinet
on the fifth floor of NEB , placed on the east side of the building
next to the entry to room 500.
Test 1 on September 29 will cover chapters 1-3 as covered in
class. You need to bring a calculator (think of spare batteries) and
one sheet with equations, both sides allowed. Please study the practice
material linked below. In the problemsession on Tuesday I will go over
any questions you may have. Good luck!
Test II on October
27 will cover chapters 4 and 5 as covered in class. You may bring 2
sheets with equations/information. Practice material is linked below.
Any questions will be answered again on the Tu problem session or
office hours. In addition HKN will provide tutoring on a weekly
basis in Larsen 115 on M 5-7 pm and Th 5-7 pm. Please check the
tutoring link on the HKN website for details
(http://www.hkn.ece.ufl.edu)
Test III will take place
on December 1 and will cover chapter 6 as covered in class. You may
bring 3 sheets with equations. A set of practice problems has been
posted under the hw link. I will work some of these problems in class
on Nov 24. No problem session on the 23rd.
The Final will take place
as scheduled on December 16 from 12:30-2:30 in our regular classroom.
The exam will be closed book, but bring 4 sheets with eqs. The exam is
comprehensive. Finals of Spring
04 and Summer 04 are
posted for your review. I will maintain my regular officehours during
finals week. No problem session however. Good luck.
Note the Sias
Undergraduate Writing Contest on the ECE website. $4000 in scholarships
for good writing!
During spring 2005 we
offer 2 tech electives in the Device area.
EEL 4331 is a class focussed on fabrication of devices and will be
taught by professor Arnost Neugroschel.
EEL 4351 is more of a theory class
introducing you to quantum mechanics as needed to understand the
operation of very advanced devices and will be taught by professor Jing
Guo.
Links to be activated:
Practice material for Test III
Practice material for Test II. IIA, IIB, IIC
Practice material for test I. Note that diffusion is not covered
for this test so ignore the problems pertaining to that. 1A, 1B,1C,
1D
Booksections to be covered/reading assignments (weekly updated)
Quiz, and
test solutions; Q1, Q2, Q3, T1, Q4, Q5, Q6, T2,
Q7, Q8, Q9, T3, Q10, Final.
Course Information
Instructor:
Office hours: M-W-F
Problem solving session: Tuesday 4:05-4:55 (period 9) in McCarty
Hall A room 1142 (MCCA)
Teaching Assistant: Samit Thakkar, email: thakkars@ufl.edu
Office hours: M. period 4, Tu. period 5, Th. period 3 in NEB 222
Course objectives: To present the theoretical and practical background of device physics so that students understand and are able to design and optimize the charge transport properties of semiconductor materials and devices.
Textbook: "Solid State Electronic Devices," Fifth Edition by Ben Streetman and Sanjay Banerjee, published by Prentice Hall
Coverage: Sections of chapters 2-7, assigned every Wednesday in advance.
Teaching philosophy: Questions and discussions during class
and
office hours are strongly encouraged. Underlying principles and gaining
insight
are more important than memorization.
Tests:
Homework:
Homework will be assigned every Wednesday. Each subsequent Wednesday a short, one problem, 10-minute quiz will be held to test the material covered by the assigned homework. These homework quizzes will count for 20% towards your final grade. Two quizzes may be skipped to allow for personal absences. Homework solutions will be scanned onto the web and linked to this page after the quiz.
Grading:
Tests I, II, and III count for 25% each, but only the two highest scores will be used. You may drop one. The final exam, cumulative, counts for 30% and the homework quizzes for 20%. The overall class average will determine the C+-B breakpoint. The A range will start one standard deviation above this point, the D+ range one standard deviation below.
Partial credit:
The following policy for test and quiz partial credit applies.
1. All requests for partial credit should be directed, in writing
and
documented, to Gijs Bosman
within one week after the work has been returned.
2. You will only receive credit for work handed in for grading.
3. You can not receive full credit for wrong answers.
Reference material:
A copy of "Semiconductor Device Fundamentals" by Pierret, used in EEL3396 in the past and a copy of "Understanding Semiconductor Devices" by
Sima Dimitrijev
have been placed on reserve in the Marston
Science Library and will be available for 2 hour check. These books
have
many
problems, covering roughly the same material we cover in class, for you
to work
through.